Advanced Photonics, Volume. 7, Issue 2, 026002(2025)

Attosecond time-resolved measurements of electron and photon beams with a variable polarization X-band radiofrequency deflector at an X-ray free-electron laser

Eduard Prat1、*, Zheqiao Geng1, Christoph Kittel1,2, Alexander Malyzhenkov3,4, Fabio Marcellini1, Sven Reiche1, Thomas Schietinger1, and Paolo Craievich1、*
Author Affiliations
  • 1Paul Scherrer Institut, Center for Accelerator Science and Engineering, Villigen, Switzerland
  • 2University of Malta, Msida, Malta
  • 3CERN, Geneva, Switzerland
  • 4Swiss International Institute Lausanne, Prilly, Switzerland
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    Figures & Tables(7)
    Schematic layout of the TDS diagnostic section. The overall length is ∼35 m, whereas the waveguide lengths from the klystron output to the TDS inputs are ∼11 and 12 m for TDS1 and TDS2, respectively. See text for more details.
    Two X-band TDSs. See text for more details.
    Measurement optics. (a) β functions along the lattice for matching at the TDS (solid lines), current profile measurements at S1 (dots), and LPS measurements at S2 (dashes). (b) Sketch of the measurement setup, where s corresponds to the longitudinal distance from the undulator exit, the big green circle indicates the X-band TDSs, the red crosses indicate the profile monitors S1 and S2, the small blue rectangles correspond to quadrupole magnets, and the large rectangle represents the dipole magnet before S2.
    Demonstration of variable polarization. (a) Images on screen S1 for different polarization angles. The deflecting voltage was 85 MV for the polarization angles between 0 and 105 deg and 73 MV for the polarization angles between 120 and 180 deg. (b) Position of the beam centroid on a BPM placed downstream of the TDS. Each color represents a different direction of the streaking field with a polarization angle step of 5 deg and a full RF phase scan. The deflecting voltage was ∼2 MV.
    Sub-femtosecond resolution measurement. (a) Single-shot streaked images for different RF TDS phases. (b) Single-shot unstreaked image. (c) Measured and fitted beam centroid variation as a function of the RF TDS phase. See text for more details.
    FEL power profile measurement. (a) Single-shot LPS images with lasing-on (left) and lasing-off (right) conditions. The horizontal and vertical scales are the same for both images. (b) Single-shot FEL power profile reconstruction. See text for more details. The horizontal and vertical scales are the same for all power profile plots.
    • Table 1. Main RF parameters of the single TDS and the complete deflecting system consisting of two TDSs and one RF pulse compressor (BOC). The frequency corresponds to operational temperatures of 33.3°C and 32.5°C for TDS1 and TDS2, respectively.

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      Table 1. Main RF parameters of the single TDS and the complete deflecting system consisting of two TDSs and one RF pulse compressor (BOC). The frequency corresponds to operational temperatures of 33.3°C and 32.5°C for TDS1 and TDS2, respectively.

      TDS parametersUnit
      Frequency11,995.2MHz
      Phase advance/cell120°C
      Iris radius4mm
      Iris thickness2.6mm
      Group velocity–2.666%c
      Quality factor6490
      Shunt impedance50MΩ/m
      Number of cells120
      Filling time129.5ns
      Total length1160mm
      Power-to-voltage6.1MV/(MW)1/2
      2×TDS+BOCUnit
      BOC Q0157,800
      BOC β7.88
      RF pulse width1.2μs
      Power-to-voltage16.08MV/(MW)1/2
      Maximum voltage90MV
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    Eduard Prat, Zheqiao Geng, Christoph Kittel, Alexander Malyzhenkov, Fabio Marcellini, Sven Reiche, Thomas Schietinger, Paolo Craievich, "Attosecond time-resolved measurements of electron and photon beams with a variable polarization X-band radiofrequency deflector at an X-ray free-electron laser," Adv. Photon. 7, 026002 (2025)

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    Paper Information

    Category: Research Articles

    Received: Oct. 29, 2024

    Accepted: Jan. 20, 2025

    Posted: Jan. 21, 2025

    Published Online: Feb. 28, 2025

    The Author Email: Prat Eduard (eduard.prat@psi.ch), Craievich Paolo (paolo.craievich@psi.ch)

    DOI:10.1117/1.AP.7.2.026002

    CSTR:32187.14.1.AP.7.2.026002

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