Acta Optica Sinica, Volume. 42, Issue 9, 0908001(2022)
High-Temperature Material Spectral Emissivity Measurement Technology Based on 800 mm Semi-Ellipsoidal Reflector
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Yongxing Yang, Xinrui Wang, Beibei Chen, Hengrui Guan, Jinpeng Li, Jingyuan Zhang, Xinhua Lai, Jinbiao Zhao. High-Temperature Material Spectral Emissivity Measurement Technology Based on 800 mm Semi-Ellipsoidal Reflector[J]. Acta Optica Sinica, 2022, 42(9): 0908001
Category: Geometric Optics
Received: Oct. 19, 2021
Accepted: Dec. 6, 2021
Published Online: May. 6, 2022
The Author Email: Yang Yongxing (nameyyan@mail.ustc.edu.cn), Li Jinpeng (lijinpeng@nairc.ac.cn)