Chinese Optics, Volume. 16, Issue 5, 1177(2023)

Method for the simultaneous measurement of waveguide propagation loss and bending loss

Zuo-wen FAN1, Lian-xi JIA1,2,3、*, Zhao-yi LI1, Jing-jie ZHOU1, Qing-yu CONG1, and Xian-feng ZENG2
Author Affiliations
  • 1Microelectronics Institute, Shanghai University, Shanghai 201800, China
  • 2Shanghai Institute of Microsystems and Information Technology, Chinese Academy of Sciences, Shanghai 201800, China
  • 3Shanghai Industrial μTechnology Research Institute, Shanghai 201800, China
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    Figures & Tables(10)
    Process flow of LN waveguide fabrication. (a) LNOI substrate. (b) Deposition of oxide by PECVD. (c) I-line lithography. (d) Hard mask etching. (e) LN etching. (f) Photoresist removal. (g) Hard mask removal. (h) Deposition of cladding by PECVD
    The SEM image of the fabricated LN waveguide
    The optical microscope image of the cut-back structure
    Layout image of the 5 sets of cutback structures for the 5 splits of the grating coupler
    (a) Simulation of the bending loss of the LN waveguide. The bending loss of the waveguide is exponentially related to the bending radius. (b) The linear fitting of the natural logarithm of the bending loss with the bending radius
    The basic process of the genetic algorithm
    The measurement results of the cut-back structure and the fitting results. (a) GC1, (b) GC2, (c) GC3, (d) GC4, (e) GC5-1, (f) GC5-2
    • Table 1. The basic information of the cut-back structure

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      Table 1. The basic information of the cut-back structure

      Length(cm)The radius of bend(μm)Number of radius
      WG10.1582100, 110100×4,110×2
      WG20.9021100,110,120,130,140,150(100-140)×4,150×2
      WG32.2054100,110,120…190,200(100-190) ×4,200×2
      WG45.2274100,110,120…290,300(100-290) ×4,300×2
      WG511.4854100,110,120…490,500(100-490) ×4,500×2
    • Table 2. The summary of the fitting results

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      Table 2. The summary of the fitting results

      α(dB/cm) αb0(dB) kαgc(dB) r
      GC10.5380.8050.044620.2200.072
      GC20.4080.6980.034615.4480.261
      GC30.5580.6980.039910.7400.044
      GC40.2090.3930.020112.1140.366
      GC5-10.1940.4160.017635.3500.355
      GC5-20.4210.3390.019429.6660.230
    • Table 3. The performance comparison of different measurement methods

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      Table 3. The performance comparison of different measurement methods

      AdvantagesDisadvantages
      Traditional cut-back[33]Widely employed owing to its ease of use.Can’t simultaneously measure the propagation loss and bending loss; Requires identical coupling conditions.
      Three-prism Method[34]Does not require constant coupling conditionsHas low measurement accuracy.
      Fabry-Perot transmission method[35]Can eliminate the influence of coupling loss and has higher accuracy Requires a complex coupling system.
      This paperCan simultaneously measure waveguide propagation loss and bending loss; Smaller footprint; Simple and convenient operation.
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    Zuo-wen FAN, Lian-xi JIA, Zhao-yi LI, Jing-jie ZHOU, Qing-yu CONG, Xian-feng ZENG. Method for the simultaneous measurement of waveguide propagation loss and bending loss[J]. Chinese Optics, 2023, 16(5): 1177

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    Paper Information

    Category: Original Article

    Received: Nov. 27, 2022

    Accepted: --

    Published Online: Oct. 27, 2023

    The Author Email: Lian-xi JIA (jialx@mail.sim.ac.cn)

    DOI:10.37188/CO.EN.2022-0027

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