INFRARED, Volume. 44, Issue 12, 7(2023)
Research on Readout Circuit Wafer Test System for Digitalization Infrared Detectors
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CHEN Yan-guan, ZHANG Yu-zhu, WANG Liang, YUAN Yuan, WANG Cheng-gang, YU Yan, NIE Yuan. Research on Readout Circuit Wafer Test System for Digitalization Infrared Detectors[J]. INFRARED, 2023, 44(12): 7
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Received: Jun. 4, 2023
Accepted: --
Published Online: Jan. 16, 2024
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