Chinese Optics Letters, Volume. 13, Issue Suppl., S22206(2015)

Measurement method for the eccentricity of an off-axis asphere with a laser tracker

Ruigang Li*
Author Affiliations
  • Key Laboratory of Optical System Advanced Manufacturing Technology, Changchun Institute of Optics, Fine Mechanics, and Physics, Chinese Academy of Sciences, Changchun 130033, China
  • show less
    Figures & Tables(5)
    Schematic of null compensating interferometry.
    Diagram of the testing procedure.
    Sketch of the eccentricity measurement layout.
    Photograph of an eccentricity measurement.
    • Table 1. Uncertainty Analysis

      View table
      View in Article

      Table 1. Uncertainty Analysis

      ItemErrorRemark
      Cylindricity of Compensatore1<0.0100mm
      Eccentricity of Compensatore2<0.0100mm
      Deflection of Compensator<5, so e3<L*tan(5)=0.1818mm
      Flatness of Aspheree4<0.0100mm
      Laser TrackerDistance accuracy: e5=2μm+L*0.4μm/m=0.0050mm; Angle accuracy: e6=10μm+L*2.5μm/m=0.0288mmFARO (ION), interferometer), distance accuracy and angle accuracy are all typical values
      Totale=Σi=16ei2=0.1859mmRoot-sum squared (RSS) of individual errors.
    Tools

    Get Citation

    Copy Citation Text

    Ruigang Li, "Measurement method for the eccentricity of an off-axis asphere with a laser tracker," Chin. Opt. Lett. 13, S22206 (2015)

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Optical Design and Fabrication

    Received: Jan. 14, 2015

    Accepted: Mar. 10, 2015

    Published Online: Aug. 8, 2018

    The Author Email: Ruigang Li (luonaerduo8979@sina.com.cn)

    DOI:10.3788/COL201513.S22206

    Topics