Infrared Technology, Volume. 44, Issue 6, 628(2022)

Research and Improvement on Reliability Growth of a Type of Infrared Thermal Imager

Qiyi WANG1、*, Likun XIA2, Bangze ZENG1, Deli ZHAO1, Youpan ZHU1, Ruotong CHEN1, Guang LI1, and Ruonan WANG1
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  • 1[in Chinese]
  • 2[in Chinese]
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    References(3)

    [4] [4] Xavier Breniere, Philippe Tribolet. IR detectors life cycle cost and reliability optimization for tactical applications[C]//Conference on Electro-Optical and Infrared Systems: Technology and Applications III, 2006: 43-47(doi: 10.1117/12.690381).

    [5] [5] Xavier Breniere, Alain Manissadjian, Vuillermet M, et al. Reliability optimization for IR detectors with compact cryo-coolers[C]//Proc. of SPIE, 2005: 187-198(doi: 10.1117/12.607591).

    [6] [6] MOLINA Marianne, BRENIERE Xavier. IR detectors dewar and assemblies for stringent environmental conditions[C]//Proc. of SPIE, 2007: 80-85(doi: 10.1117/12.721647).

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    WANG Qiyi, XIA Likun, ZENG Bangze, ZHAO Deli, ZHU Youpan, CHEN Ruotong, LI Guang, WANG Ruonan. Research and Improvement on Reliability Growth of a Type of Infrared Thermal Imager[J]. Infrared Technology, 2022, 44(6): 628

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    Paper Information

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    Received: Oct. 19, 2021

    Accepted: --

    Published Online: Jul. 25, 2022

    The Author Email: Qiyi WANG (wqy11wqy@163.com)

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