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Laser & Optoelectronics Progress, Volume. 58, Issue 4, 0410019(2021)

Speckle Quality Evaluation Based on Gray Level Co-Occurrence Matrix

Lu Chu1,2, Bin Liu1,2、*, Liang Xu1,2、*, Zhiwei Li1,2, and Baofeng Zhang1,2
Author Affiliations
  • 1School of Electrical and Electronic Engineering, Tianjin University of Technology, Tianjin 300384, China
  • 2Tianjin Key Laboratory for Control Theory & Applications in Complicated Systems, Tianjin 300384, China;
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    Article index updated: Mar. 15, 2025

    The article is cited by 6 article(s) CLP online library. (Some content might be in Chinese.)
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    Lu Chu, Bin Liu, Liang Xu, Zhiwei Li, Baofeng Zhang. Speckle Quality Evaluation Based on Gray Level Co-Occurrence Matrix[J]. Laser & Optoelectronics Progress, 2021, 58(4): 0410019

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    Paper Information

    Category: Image Processing

    Received: Jul. 10, 2020

    Accepted: Aug. 11, 2020

    Published Online: Feb. 24, 2021

    The Author Email: Liu Bin (liangx999@163.com), Xu Liang (liangx999@163.com)

    DOI:10.3788/LOP202158.0410019

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology