Journal of Semiconductors, Volume. 41, Issue 8, 082006(2020)

First-principle study of puckered arsenene MOSFET

Hengze Qu, Ziwei Lin, Ruijuan Guo, Xiyu Ming, Wenhan Zhou, Shiying Guo, Xiufeng Song, Shengli Zhang, and Haibo Zeng
Author Affiliations
  • Key Laboratory of Advanced Display Materials and Devices, Ministry of Industry and Information Technology, College of Material Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, China
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    Hengze Qu, Ziwei Lin, Ruijuan Guo, Xiyu Ming, Wenhan Zhou, Shiying Guo, Xiufeng Song, Shengli Zhang, Haibo Zeng. First-principle study of puckered arsenene MOSFET[J]. Journal of Semiconductors, 2020, 41(8): 082006

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    Paper Information

    Category: Articles

    Received: May. 31, 2020

    Accepted: --

    Published Online: Sep. 10, 2021

    The Author Email:

    DOI:10.1088/1674-4926/41/8/082006

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