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Chinese Optics Letters, Volume. 16, Issue 8, 082601(2018)

Full-transparent zone plates for THz focusing

Hui Yin1...2, Jiaqi Li1,2, Huawei Liang1,2,*, Min Zhang1,2,**, Hong Su1,2, and Ireng Ling Li12 |Show fewer author(s)
Author Affiliations
  • 1Shenzhen Key Laboratory of Laser Engineering, Shenzhen University, Shenzhen 518060, China
  • 2Guangdong Provincial Key Laboratory of Micro/Nano Optomechatronics Engineering, Shenzhen University, Shenzhen 518060, China
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    Schematics of the (a) FZP and (b) FTZP.

    Fig. 1. Schematics of the (a) FZP and (b) FTZP.

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    Dependence of the THz wave transmission on the substrate thickness. The peak intensity at the focal point for the focal length f=5 cm is shown by the point solid line, and the transmission rate is shown by the dashed line.

    Fig. 2. Dependence of the THz wave transmission on the substrate thickness. The peak intensity at the focal point for the focal length f=5  cm is shown by the point solid line, and the transmission rate is shown by the dashed line.

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    THz field intensities on the longitudinal sections for the focusing of FTZPs: (a) f=4 cm, (b) f=5 cm, (c) f=6 cm; and FZPs: (d) f=4 cm, (e) f=5 cm, (f) f=6 cm.

    Fig. 3. THz field intensities on the longitudinal sections for the focusing of FTZPs: (a) f=4  cm, (b) f=5  cm, (c) f=6  cm; and FZPs: (d) f=4  cm, (e) f=5  cm, (f) f=6  cm.

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    (a) Experimental setup for the FTZP focusing. (b) FTZP sample.

    Fig. 4. (a) Experimental setup for the FTZP focusing. (b) FTZP sample.

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    Measured THz intensity distributions on the focal planes for FTZPs: (a) f=4 cm, (b) f=5 cm, (c) f=6 cm; and FZPs: (d) f=4 cm, (e) f=5 cm, (f) f=6 cm.

    Fig. 5. Measured THz intensity distributions on the focal planes for FTZPs: (a) f=4  cm, (b) f=5  cm, (c) f=6  cm; and FZPs: (d) f=4  cm, (e) f=5  cm, (f) f=6  cm.

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    Hui Yin, Jiaqi Li, Huawei Liang, Min Zhang, Hong Su, Ireng Ling Li, "Full-transparent zone plates for THz focusing," Chin. Opt. Lett. 16, 082601 (2018)

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    Paper Information

    Category: Physical Optics

    Received: Apr. 9, 2018

    Accepted: Jun. 6, 2018

    Published Online: Aug. 2, 2018

    The Author Email: Huawei Liang (hwliang@szu.edu.cn), Min Zhang (zhangmin@szu.edu.cn)

    DOI:10.3788/COL201816.082601

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology