Measurement and Calculation of Anisotropic Polymer Film Parameters

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Acta Optica Sinica, Volume. 18, Issue 4, 486(1998)

[in Chinese]¹, [in Chinese]¹, [in Chinese]², [in Chinese]², [in Chinese]², and [in Chinese]²

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¹[in Chinese]

²[in Chinese]

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References(4)

[1] [1] R. Ulrich. Theory of the prism-film coupler by plane-wave analysis. J. Opt. Soc. Am., 1970, 60(10): 1337～1350

[2] [2] Tie-Nan Ding, E. Garmire. Measurement of thin film parameters using substrate excitation of leaky modes. Opt. Commun., 1983, 48(2): 113～115

[3] [3] Tie-Nan Ding, E. Garmire. Measuring refractive index and thickness of thin films: A new technique. Appl. Opt., 1983, 22(20): 3177～3181

[4] [4] R. Ulrich, R. Torge. Measurement of thin film parameters with a prism coupler. Appl. Opt., 1973, 12(12): 2901～2908

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement and Calculation of Anisotropic Polymer Film Parameters[J]. Acta Optica Sinica, 1998, 18(4): 486

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Paper Information

Category: Thin Films

Received: Jan. 16, 1997

Accepted: --

Published Online: Oct. 18, 2006

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DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology