Acta Optica Sinica, Volume. 44, Issue 9, 0912001(2024)
Three-Dimensional Measurement of Complex Textured Objects Based on Bidirectional Fringe Projection
[1] Gorthi S S, Rastogi P. Fringe projection techniques: whither we are?[J]. Optics and Lasers in Engineering, 48, 133-140(2010).
[2] Ding S W, Zhang X H, Yu Q F et al. Overview of non-contact 3D reconstruction measurement methods[J]. Laser & Optoelectronics Progress, 54, 070003(2017).
[3] Zuo C, Feng S J, Huang L et al. Phase shifting algorithms for fringe projection profilometry: a review[J]. Optics and Lasers in Engineering, 109, 23-59(2018).
[4] Xia C X, Hao Q, Zhang Y M et al. Face feature detection based on structured light projection three-dimensional reconstruction[J]. Laser & Optoelectronics Progress, 60, 2211004(2023).
[5] Feng S J, Xiao Y L, Yin W et al. Fringe-pattern analysis with ensemble deep learning[J]. Advanced Photonics Nexus, 2, 036010(2023).
[6] Da F P, Gai S Y[M]. Fringe projection 3D precision measurement(2011).
[7] Zhao L W, Da F P, Zheng D L. Method for binary grating generation using defocused projection for three-dimensional measurement[J]. Acta Optica Sinica, 36, 0812005(2016).
[8] Rao L, Da F P. Local blur analysis and phase error correction method for fringe projection profilometry systems[J]. Applied Optics, 57, 4267-4276(2018).
[9] Fang Y Y. Research on discontinuous area error compensation of structured light 3D imaging method[D], 17-23(2020).
[10] Joshi N, Szeliski R, Kriegman D J. PSF estimation using sharp edge prediction[C](2008).
[11] Hu C P, Liu S T, Wu D et al. Phase error model and compensation method for reflectivity and distance discontinuities in fringe projection profilometry[J]. Optics Express, 31, 4405-4422(2023).
[12] Wu Y X, Cai X J, Zhu J J et al. Analysis and reduction of the phase error caused by the non-impulse system psf in fringe projection profilometry[J]. Optics and Lasers in Engineering, 127, 105987(2020).
[13] Weng J W, Ouyang H Y, Yang C P. Single pixel imaging based on fringe projection with amplitude spatial modulation[J]. Acta Optica Sinica, 41, 1511003(2021).
[14] Zhao Z D, Yang Z H, Yu Y J. Research progress of single pixel imaging[J]. Chinese Journal of Lasers, 49, 1917001(2022).
[15] Edgar M P, Gibson G M, Padgett M J. Principles and prospects for single-pixel imaging[J]. Nature Photonics, 13, 13-20(2019).
[16] Zhang Z B, Wang X Y, Zheng G A et al. Fast Fourier single-pixel imaging via binary illumination[J]. Scientific Reports, 7, 12029(2017).
[17] Lu T A, Qiu Z H, Zhang Z B et al. Comprehensive comparison of single-pixel imaging methods[J]. Optics and Lasers in Engineering, 134, 106301(2020).
[18] Ma Y Y, Yin Y K, Jiang S et al. Single pixel 3D imaging with phase-shifting fringe projection[J]. Optics and Lasers in Engineering, 140, 106532(2021).
[19] Wang Y F, Zhao H J, Jiang H Z et al. Paraxial 3D shape measurement using parallel single-pixel imaging[J]. Optics Express, 29, 30543-30557(2021).
[20] Jiang H Z, Li Y X, Zhao H J et al. Parallel single-pixel imaging: a general method for direct-global separation and 3D shape reconstruction under strong global illumination[J]. International Journal of Computer Vision, 129, 1060-1086(2021).
[21] Lü N Q, Yu H T, Xu X Y et al. Structured light 3-D sensing for scenes with discontinuous reflectivity: error removal based on scene reconstruction and normalization[J]. Optics Express, 31, 20134-20149(2023).
[22] Blanchard C, Zhang S. Removal of phase artifacts from high-contrast texture for 3D fringe projection system[J]. Proceedings of SPIE, 12098, 1209805(2022).
[23] Zhang Q C, Su X Y, Xiang L Q et al. 3-D shape measurement based on complementary Gray-code light[J]. Optics and Lasers in Engineering, 50, 574-579(2012).
[24] Zhang Z Y. Flexible camera calibration by viewing a plane from unknown orientations[C], 666-673(2002).
Get Citation
Copy Citation Text
Wei Zhang, Yuchong Chen, Pengcheng Yao, Shaoyan Gai, Feipeng Da. Three-Dimensional Measurement of Complex Textured Objects Based on Bidirectional Fringe Projection[J]. Acta Optica Sinica, 2024, 44(9): 0912001
Category: Instrumentation, Measurement and Metrology
Received: Jan. 16, 2024
Accepted: Feb. 23, 2024
Published Online: May. 10, 2024
The Author Email: Feipeng Da (dafp@seu.edu.cn)
CSTR:32393.14.AOS240508