Chinese Journal of Lasers, Volume. 26, Issue 11, 982(1999)
A New Method for Recovering the Original Wave-front in Lateral-shearing Interferometry
References(3)
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[2] [2] G. Makosch, B. Drollinger. Surface profile measurement with a scanning differential ac interferometer. Appl. Opt.,1984,23(24):4544～4553
[3] [3] Xu Wendong, Li Xishan. Measurement of surface roughness of optical disk substrates by differential polarization interferometry. Proc. SPIE, 1993, 2053:118～125
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[in Chinese], [in Chinese], [in Chinese]. A New Method for Recovering the Original Wave-front in Lateral-shearing Interferometry[J]. Chinese Journal of Lasers, 1999, 26(11): 982
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