Acta Optica Sinica, Volume. 25, Issue 4, 465(2005)

Numerical Analysis of Interaction and Perturbation between Evanescent Field and Probe in Optical Field Detection by SNOM

[in Chinese]*, [in Chinese], [in Chinese], and [in Chinese]
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    CLP Journals

    [1] Yan Feng, Zhou Ming, Fan Xiaomeng, Zhang Wei. Near-Field Nanofabrication Technology Base on Local Field Enhancement Effect[J]. Acta Optica Sinica, 2008, 28(s1): 176

    [2] Wang Zhao, Wu Shifa, Li Hong, Liu Kun. Measuring Inclination and Refractive Index of the Sample in Collection-Mode Scanning Near-Field Optical Microscope with Controllable Illumination[J]. Acta Optica Sinica, 2010, 30(8): 2272

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Numerical Analysis of Interaction and Perturbation between Evanescent Field and Probe in Optical Field Detection by SNOM[J]. Acta Optica Sinica, 2005, 25(4): 465

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    Paper Information

    Category: Imaging Systems

    Received: Mar. 22, 2004

    Accepted: --

    Published Online: May. 22, 2006

    The Author Email: (xutiejun@tsinghua.org.cn)

    DOI:

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