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Chinese Journal of Lasers, Volume. 26, Issue 8, 763(1999)

Study of the Technology of Small Spot Scanning for Laser Conditioning of Optical Coatings at 532 nm

[in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]2, [in Chinese]2, and [in Chinese]2
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    [1] [1] M. R. Kozlowski, G. R. Wolfe, M. C. Staggs et al.. Large area laser conditioning of dielectric thin film mirrors. Laser Induced Damage in Optical Materials, 1989, NIST(USA) Spec.Publ.801, 376～390

    [2] [2] B. Brauns, B. Schafer, R. Wolfe et al.. Effect of the substrate preparation with CO2 laser radiation on the laser resistance of optical layers. Thin Solid Films, 1986, 138(2):157～162

    [3] [3] Zhao Qiang, Fan Zhengxiu, Wang Zhijiang. Study on laser conditioning of optical coatings. Chinese J. Lasers, 1996, B5(4):371～374

    [4] [4] Peifu Gu. Technology of Thin Film Coating. Zhejiang: Zhejiang University Publishing House, 1990. 200～217

    [5] [5] C. R. Wolfe, M. R. Kozlowski, J. H. Campbell et al.. Laser conditioning of optical thin films. Proc. SPIE, 1989,1438:360～375

    CLP Journals

    [1] Liu Xiaofeng, Li Dawei, Li Xiao, Zhao Yuan’an, Shao Jianda. 1064 nm Laser Conditioning Effect of HfO2/SiO2 High Reflectors Deposited by E-Beam[J]. Chinese Journal of Lasers, 2009, 36(6): 1545

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study of the Technology of Small Spot Scanning for Laser Conditioning of Optical Coatings at 532 nm[J]. Chinese Journal of Lasers, 1999, 26(8): 763

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    Paper Information

    Category: materials and thin films

    Received: Nov. 23, 1998

    Accepted: --

    Published Online: Aug. 9, 2006

    The Author Email:

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology