Enhanced characterization of depolarizing samples using indices of polarization purity and polarizance–reflection–transformation spaces

Dekui Li; Ivan Montes; Mónica Canabal-Carbia; Irene Estévez; Octavi Lopez-Coronado; Zhongyi Guo; Juan Campos; Ángel Lizana

doi:10.1117/1.APN.4.1.016009

Advanced Photonics Nexus, Volume. 4, Issue 1, 016009(2025)

Enhanced characterization of depolarizing samples using indices of polarization purity and polarizance–reflection–transformation spaces

Dekui Li^1、†, Ivan Montes², Mónica Canabal-Carbia², Irene Estévez², Octavi Lopez-Coronado², Zhongyi Guo^1、*, Juan Campos², and Ángel Lizana^2、*

Author Affiliations

¹Hefei University of Technology, School of Computer and Information, Hefei, China

²Autonomous University of Barcelona, Department of Physics, Optics Group, Bellaterra, Spain

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Dekui Li, Ivan Montes, Mónica Canabal-Carbia, Irene Estévez, Octavi Lopez-Coronado, Zhongyi Guo, Juan Campos, Ángel Lizana, "Enhanced characterization of depolarizing samples using indices of polarization purity and polarizance–reflection–transformation spaces," Adv. Photon. Nexus 4, 016009 (2025)

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Paper Information

Category: Research Articles

Received: Jun. 12, 2024

Accepted: Dec. 12, 2024

Published Online: Jan. 10, 2025

The Author Email: Zhongyi Guo (guozhongyi@hfut.edu.cn), Ángel Lizana (angel.lizana@uab.es)

DOI:10.1117/1.APN.4.1.016009

CSTR:32397.14.1.APN.4.1.016009

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology