Researching | Analysis and Improvement of Corner White Mura in TFT‑LCD

Optoelectronic Technology, Volume. 43, Issue 2, 177(2023)

Analysis and Improvement of Corner White Mura in TFT‑LCD

Yelu XU

Author Affiliations

Xiamen Tianma Microelectronics Co., Ltd., Xiamen Fujian 361000, CHN

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Figures & Tables(9)

Fig. 1. Phenomenon of corner white dot

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Fig. 2. Data types and analysis tools

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Fig. 3. Microscopic phenomenon of corner white Mura

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Fig. 4. Binary logistic regression analysis

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Fig. 5. Iron analysis results of TOF-SIMS

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Fig. 6. Curing process of sealant

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Fig. 7. The guessed mechanism

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Table 1. Analysis methods

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Table 1. Analysis methods

分析方法	现象	后续方向
带偏光片观察	电测可见	排查是否偏光片干扰
无偏光片观察	电测可见	面板相关不良，排查面板
旋转偏光片观察	蓝或黄画面形态变化	盒厚相关型不良，排查成盒工艺或PS柱
旋转偏光片观察	蓝或黄画面形态不变化	非盒厚相关型不良，排查TFT/CF/成盒工艺
拆盒观察	显微镜可见TFT侧异常	TFT相关膜层进一步分析
	显微镜可见CF侧异常	CF相关膜层进一步分析
	显微镜未见异常	电性或盒内相关
异常放电观察	不良形态变化	电性或盒内相关
烘烤后观察	不良程度不变化	电性相关，排查TFT器件
烘烤后观察	不良程度变轻或消失	盒内相关

Table 2. Experimental conditions and results

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Table 2. Experimental conditions and results

验证类别	条件	不良率/（%）
对照组	正常条件	11.50
液晶滴下方式变更	靠近框胶	9.80
	远离框胶1	12.30
	远离框胶2	9.60
封框胶调整	UV照射时间延长	6.80
	UV照射功率增加	6.30
	框胶远离金属走线	0.10

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Yelu XU. Analysis and Improvement of Corner White Mura in TFT‑LCD[J]. Optoelectronic Technology, 2023, 43(2): 177

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Paper Information

Category: Research and Trial-manufacture

Received: Dec. 2, 2022

Accepted: --

Published Online: Aug. 31, 2023

The Author Email:

DOI:10.19453/j.cnki.1005-488x.2023.02.012

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology