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OPTICS & OPTOELECTRONIC TECHNOLOGY, Volume. 10, Issue 1, 13(2012)

Development and Accuracy Certification of Infrared Camera Test System

LI Ying-wen*, YANG Chang-cheng, CHE Chi-cheng, and HONG Tao
Author Affiliations
  • Huazhong Institute of Electro-Optics- Wuhan National Laboratory for Optoelectronics,Wuhan 430073,China
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    [2] [2] Paul A Bell, Stanley J Pruchnic, Edward M Lewis. Evaluation of temporal stability and spatial uniformity of blackbody thermal reference source［C］. SPIE, 1995, 2470: 300-311.

    [3] [3] Chis Kauffman, John Madigan, William Pfister. Static image system MRTD modeling［C］. SPIE, 1998, 3377: 83-88.

    [4] [4] Wolfgang Wittenstein, Wolfgang Fick, Urban Raidt. Simulation study of fixed pattern noise and MRTD［C］. SPIE, 1995, 2552: 489-501.

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    LI Ying-wen, YANG Chang-cheng, CHE Chi-cheng, HONG Tao. Development and Accuracy Certification of Infrared Camera Test System[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2012, 10(1): 13

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    Paper Information

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    Received: Sep. 21, 2011

    Accepted: --

    Published Online: Apr. 19, 2012

    The Author Email: Ying-wen LI (cnoldhawk@yahoo.com)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology