Fig. 1. Structures of silicon photonics integrated circuits corresponding to the transformation matrices M₀ and M₄₅. (a) The structure corresponds to matrix M₀; (b) the structure corresponds to matrix M₄₅.

Fig. 2. Structure and photograph of silicon photonics integrated DPC. PD, photodiode. (a) The structure of the DPC; (b) the photograph of the DPC.

Fig. 3. Characterization of the TPS. (a) The phase shift versus the consumed power of the thermal heater; (b) the rise and fall time of the MZ modulator.

Fig. 4. Flow chart of the variable step simulated annealing method.

Fig. 5. Simulation results of dynamic polarization control. It represents the extinction ratio versus the number of the internal loops with fixed and variable step simulated annealing methods. The noise and static polarization extinction ratio were considered. N, noise; SPER, static polarization extinction ratio.

Fig. 6. Experimental setup to test the silicon photonics integrated DPC. MPC, manual polarization controller; MF, multifunctional.

Fig. 7. Experiment results of dynamic polarization control. It represents the extinction ratio versus the number of internal loops with fixed and variable step simulated annealing methods.