Opto-Electronic Engineering, Volume. 35, Issue 5, 85(2008)

Customization Design of Phase Plate for Extended Depth of Field

MO Xu-tao1,2、*, LIU Wen-yao1,2, and WANG Jin-jiang1,2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    CLP Journals

    [1] XIE Yong-jun, SHI Tie-lin, LIU Shi-yuan. Measurement System for 3D Profile of Micro/Nano Structures with High Resolution[J]. Opto-Electronic Engineering, 2010, 37(1): 19

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    MO Xu-tao, LIU Wen-yao, WANG Jin-jiang. Customization Design of Phase Plate for Extended Depth of Field[J]. Opto-Electronic Engineering, 2008, 35(5): 85

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    Paper Information

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    Received: Jul. 24, 2007

    Accepted: --

    Published Online: Mar. 1, 2010

    The Author Email: Xu-tao MO (mxt_tju@163.com)

    DOI:

    CSTR:32186.14.

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