Acta Optica Sinica, Volume. 42, Issue 7, 0712003(2022)

Three-Dimensional Measurement Method of Defects Based on Binocular Grating Reconstruction and Texture Mapping

Guanyu Hou1, Bin Wu1、*, Rongfang He2、**, and Weibin Zhang2
Author Affiliations
  • 1National Key Laboratory of Precision Testing Techniques and Instrument, Tianjin University, Tianjin 300072, China
  • 2Institute of Chemical Materials, China Academy of Engineering Physics, Mianyang, Sichuan 621999, China
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    Figures & Tables(13)
    Schematic diagram of binocular grating projection reconstruction system
    3D reconstruction system with turntable and texture camera
    Comparison of effect of texture mapping before and after occlusion judgment. (a) Original point cloud data; (b) direct apping result; (c) texture image; (d) mapping result after occlusion judgment (eliminated points are displayed in black)
    Segmentation and search method of finding four closest points
    Conversion of selected image pixels to spatial points
    Measurement system structure
    Two kinds of test objects and their defect labels. (a) Test object 1; (b) test object 2
    Reconstruction results of 5 scratches on the inner surface of the test object 1. (a) Reconstruction result obtained by the interpolation method proposed in this paper; (b) reconstruction result by using the method of direct searching to find the point cloud in the contour
    Comparison of measured defect widths and results of image measurement instrument
    Reconstruction results of surface defects of test object. (a) Reconstruction result after point cloud interpolation; (b) reconstruction result obtained by using method of direct searching point clouds in contour
    Defect distance measurement data and error
    • Table 1. Defect width measurement data and error

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      Table 1. Defect width measurement data and error

      Defect serialnumberWidth measured by imagemeasurement instrument /mmAverage width measured bymethod in this paper /mmMax error /mmAverage error /mm
      10.6430.7150.1130.072
      20.9060.9680.1670.090
      31.3081.3420.1270.109
      41.4811.5580.1230.086
      51.7221.7610.0910.041
    • Table 2. Simulated defect area measurement results

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      Table 2. Simulated defect area measurement results

      Defect serial number123456
      Theoretical value /mm230.00030.00019.6358.0004.0003.897
      Interpolation area /mm228.97024.22115.1433.2013.6574.321
      No interpolated area /mm224.11914.73713.6412.5431.7581.194
      Defect serial number7891011
      Theoretical value /mm2//5.000//
      Interpolation area /mm2105.71612.4125.02218.957198.860
      No interpolated area /mm297.4638.8012.97415.955229.853
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    Guanyu Hou, Bin Wu, Rongfang He, Weibin Zhang. Three-Dimensional Measurement Method of Defects Based on Binocular Grating Reconstruction and Texture Mapping[J]. Acta Optica Sinica, 2022, 42(7): 0712003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Aug. 9, 2021

    Accepted: Oct. 15, 2021

    Published Online: Mar. 28, 2022

    The Author Email: Wu Bin (wubin@tju.edu.cn), He Rongfang (herongfang@caep.cn)

    DOI:10.3788/AOS202242.0712003

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