Research on the all-Stokes vector measurement and correction method via elastic-optic difference frequency modulation

Qin Bai; Rui Zhang; Peng Xue; Zhibin Wang; Quanhuizi Kong

doi:10.12086/oee.2025.240284

Opto-Electronic Engineering, Volume. 52, Issue 5, 240284(2025)

Research on the all-Stokes vector measurement and correction method via elastic-optic difference frequency modulation

Qin Bai^1,2, Rui Zhang^1,2、*, Peng Xue¹, Zhibin Wang¹, and Quanhuizi Kong^1,2

¹Technology Innovation Center of Shanxi Provincial for Intelligent Microwave Photoelectric, North University of China, Taiyuan, Shanxi 030051, China

²School of Information and Communication Engineering, North University of China, Taiyuan, Shanxi 030051, China

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Fig. 1. PEM voltage drive control. (a) PEM control structure; (b) Piezoelectric effect simulation structure

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Fig. 2. Basic principle diagram of hetero-dyne modulation Stokes measurement

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Fig. 3. Elastic optical difference frequency modulation Stokes measuring device

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Fig. 4. Stokes vector measurement results of elliptically polarized light. (a) S₁ for different elliptically polarized light is measured; (b) S₂ for different elliptically polarized light is measured; (c) S₃ for different elliptically polarized light is measured

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Table 1. Variance of measured data of 5 different elliptically polarized light

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Table 1. Variance of measured data of 5 different elliptically polarized light

Parameter	Polarization state 1	Ppolarization state 2	Polarization stadte 3	Polarization state 4	Polarization state 5
S₁	$1.0 \times 10^{- 5}$	$1.1 \times 10^{- 6}$	$1.9 \times 10^{- 5}$	$7.2 \times 10^{- 6}$	$1.9 \times 10^{- 7}$
S₂	$2.7 \times 10^{- 5}$	$3.1 \times 10^{- 6}$	$1.6 \times 10^{- 5}$	$7.4 \times 10^{- 6}$	$9.8 \times 10^{- 6}$
S₃	$2.3 \times 10^{- 6}$	$5.7 \times 10^{- 7}$	$1.1 \times 10^{- 5}$	$1.3 \times 10^{- 5}$	$1.4 \times 10^{- 5}$

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Qin Bai, Rui Zhang, Peng Xue, Zhibin Wang, Quanhuizi Kong. Research on the all-Stokes vector measurement and correction method via elastic-optic difference frequency modulation[J]. Opto-Electronic Engineering, 2025, 52(5): 240284

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Paper Information

Category: Article

Received: Dec. 3, 2024

Accepted: Mar. 31, 2025

Published Online: Jul. 18, 2025

The Author Email: Rui Zhang (张瑞)

DOI:10.12086/oee.2025.240284

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology