Relative Intensity Noise Measurement of a Single‐Frequency Laser with Ultralow Background

Yihang Yu; Hailin Hu; Dijun Chen; Fang Wei; Fei Yang

doi:10.3788/CJL230592

Chinese Journal of Lasers, Volume. 50, Issue 22, 2201003(2023)

Relative Intensity Noise Measurement of a Single‐Frequency Laser with Ultralow Background

Yihang Yu¹, Hailin Hu^1,2, Dijun Chen¹, Fang Wei¹, and Fei Yang^1、*

¹Key Laboratory of Space Laser Communication and Detection Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

²School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China

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Yihang Yu, Hailin Hu, Dijun Chen, Fang Wei, Fei Yang. Relative Intensity Noise Measurement of a Single‐Frequency Laser with Ultralow Background[J]. Chinese Journal of Lasers, 2023, 50(22): 2201003

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Paper Information

Category: laser devices and laser physics

Received: Mar. 6, 2023

Accepted: Mar. 23, 2023

Published Online: Nov. 17, 2023

The Author Email: Yang Fei (fyang@siom.ac.cn)

DOI:10.3788/CJL230592

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology