Acta Optica Sinica, Volume. 38, Issue 8, 0816001(2018)

Preparation and Characteristics of Middle and Far Infrared Stealth of Photonic Crystal Film

Ruihuang Liu*, Dapeng Zhao, Jikui Zhang, Hailong Dong, and Jiaming Shi*
Author Affiliations
  • State Key Laboratory of Pulsed Power Laser Technology, National University of Defense Technology, Hefei, Anhui 230037, China
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    Figures & Tables(10)
    Ideal reflection curves of infrared stealthy materials
    Designed PC thin film structure
    Theoretical reflection curves of PC
    Cross-sectional SEM image of PC
    Practical infrared reflection curves of three kinds of stealthy materials
    Experimental model of testing infrared stealth characteristics
    Mid-infrared thermograms along different observation directions
    Far-infrared thermograms along different observation directions
    • Table 1. Reflectivity of three kinds of stealthy materials at middle and far infrared bands

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      Table 1. Reflectivity of three kinds of stealthy materials at middle and far infrared bands

      Wavelength band /μmm1m2m3
      3-50.660.110. 21
      8-140.630.100.19
    • Table 2. Radiation temperatures of mid- and far-infrared thermograms along four directions

      View table

      Table 2. Radiation temperatures of mid- and far-infrared thermograms along four directions

      SampleMid-infrared bandFar-infrared band
      EastSouthWestNorthEastSouthWestNorth
      m124.528.834.525.19.0133.110.721.8
      m251.752.752.652.953.358.154.756.4
      m347.147.451.746.735.642.837.239.2
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    Ruihuang Liu, Dapeng Zhao, Jikui Zhang, Hailong Dong, Jiaming Shi. Preparation and Characteristics of Middle and Far Infrared Stealth of Photonic Crystal Film[J]. Acta Optica Sinica, 2018, 38(8): 0816001

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    Paper Information

    Category: Materials

    Received: Jan. 19, 2018

    Accepted: Apr. 9, 2018

    Published Online: Sep. 6, 2018

    The Author Email:

    DOI:10.3788/AOS201838.0816001

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