Journal of Infrared and Millimeter Waves, Volume. 26, Issue 2, 149(2007)

DEVELOPMENT OF SPECTRAL EMISSIVITY MEASUREMENT SYSTEM BASED ON FOURIER TRANSFORM INFRARED SPECTROMETER ( FTIR )

[in Chinese], [in Chinese], and [in Chinese]
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    References(7)

    [1] [1] Cezairliyan A,McClure J,Laylor R.Thermophysical measurements on 90Ti-6Al-4V alloy above 1450K using a transinent (subsecond) technique[J].Journal of Research of the National Bureau of Standards,Section A,Physics and Chemistry,1977,81 (3):251-256.

    [2] [2] Righini F,Roberts R B,Rosso A.Measutrment of thermophysical properties by a pulse-heatingmethod:niobium in the range 1000-2500K[J].International Journal of Thermophysics,1985,6(6):681~93.

    [3] [3] Kaschnitz E,Pottlacher G,Jaeger H.New microsecond pulse-heating system to investigate thermophysical properties of solid and liquid metals[J].International Journal of Thermophysics,1992,13(4):699-710.

    [4] [4] Dai J M,Fan Y,Chu Z X.Development of a millisecond pulse-heating apparatus[J].International Journal of Thermophysics,2002,23(5):1401-1405.

    [6] [6] Liu Baoming,Chu Zaixiang.Effect of deviation of cavity temperature and wall emissivity on accuracy of material emissivity measurement[C].10th European Conference on Thermophysical Properties,Yugoslavia:Dubrovnik,July26-30,1986:22-26.

    [7] [7] Ishii J,Ono A.Fourier transform spectrometer for thermalinfrared emissivity measurements near room temperatures[C].proceedings of SPIE,2000,4103:126-132.

    [8] [8] Dai J M,Liu X D.Equipment for the spectral characterization of high-temperature particles[J].International Journal of Thermophysics,2005,26 (4):1207-1213.

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    [in Chinese], [in Chinese], [in Chinese]. DEVELOPMENT OF SPECTRAL EMISSIVITY MEASUREMENT SYSTEM BASED ON FOURIER TRANSFORM INFRARED SPECTROMETER ( FTIR )[J]. Journal of Infrared and Millimeter Waves, 2007, 26(2): 149

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    Paper Information

    Received: Jul. 17, 2006

    Accepted: --

    Published Online: Aug. 17, 2008

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