Chinese Journal of Lasers, Volume. 9, Issue 8, 551(1982)

The higher order ion X-ray spectrum of microfilings falling onto the glass mieroballoons excited by high power laser light can be identified by T1AB X-ray crystal spectrometer, thereby it is helpful for trace analysis.

[in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
  • show less
    References(0)
    Tools

    Get Citation

    Copy Citation Text

    [in Chinese], [in Chinese], [in Chinese]. The higher order ion X-ray spectrum of microfilings falling onto the glass mieroballoons excited by high power laser light can be identified by T1AB X-ray crystal spectrometer, thereby it is helpful for trace analysis.[J]. Chinese Journal of Lasers, 1982, 9(8): 551

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: laser devices and laser physics

    Received: Nov. 25, 1981

    Accepted: --

    Published Online: Aug. 23, 2012

    The Author Email:

    DOI:

    CSTR:32186.14.

    Topics