Chinese Journal of Lasers, Volume. 9, Issue 8, 551(1982)
The higher order ion X-ray spectrum of microfilings falling onto the glass mieroballoons excited by high power laser light can be identified by T1AB X-ray crystal spectrometer, thereby it is helpful for trace analysis.
Get Citation
Copy Citation Text
[in Chinese], [in Chinese], [in Chinese]. The higher order ion X-ray spectrum of microfilings falling onto the glass mieroballoons excited by high power laser light can be identified by T1AB X-ray crystal spectrometer, thereby it is helpful for trace analysis.[J]. Chinese Journal of Lasers, 1982, 9(8): 551
Category: laser devices and laser physics
Received: Nov. 25, 1981
Accepted: --
Published Online: Aug. 23, 2012
The Author Email:
CSTR:32186.14.