Journal of Infrared and Millimeter Waves, Volume. 39, Issue 3, 290(2020)
Fig. 1. Doping profile of As concentration in the infrared-active layer by four-different-energy ion-implanted scheme
Fig. 3. (a)BIB detector’s partial enlarged detail and( b)package of BIB detector
Get Citation
Copy Citation Text
Chao WANG, Ning LI, Ning DAI, Wang-Zhou SHI, Gu-Jin HU.
Category: Materials and Devices
Received: Oct. 5, 2019
Accepted: --
Published Online: Jul. 7, 2020
The Author Email: Ning DAI (hugj@shnu.edu.cn)