Chinese Journal of Lasers, Volume. 32, Issue 6, 761(2005)

Investigation on Properties of Reflection Phase Retarder

[in Chinese]1,2、*, [in Chinese]1,2, [in Chinese]1,2, [in Chinese]1, [in Chinese]1, and [in Chinese]1
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  • 1[in Chinese]
  • 2[in Chinese]
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    References(11)

    [1] [1] W. H. Southwell. Multiplayer coatings producing 90° phase change [J]. Appl. Opt., 1979, 18(11): 1875~1878

    [2] [2] W. H. Southwell. Multiplayer coating design achieving a broadband 90° phase shift [J]. Appl. Opt., 1980, 19(16): 2688~2692

    [3] [3] Joseph H. Apfel. Phase retardance of periodic multiplayer mirrors [J]. Appl. Opt., 1982, 21(4): 733~738

    [4] [4] Joseph H. Apfel. Graphical method to design multiplayer phase retarders [J]. Appl. Opt., 1981, 20(6): 1024~1029

    [5] [5] R. M. A Azzam, Bruce E. Perilloux. Constraint on the optical constants of a film-substrate system for operation as an external-reflection retarder at a given angle of incidence [J]. Appl. Opt., 1985, 24(8): 1171~1179

    [6] [6] A. M. Kan′an, R. M. A. Azzam. In-line quarter-wave retarders for the infrared using total reflection and total internal reflection in a prism [J]. Opt. Eng., 1994, 33(6): 2029~2033

    [7] [7] M. M. K. Howlader, R. M. A. Azzam. Periodic and quasiperiodic nonquarterwave multiplayer coatings for 90-deg reflection phase retardance at 45-deg angle of incidence [J]. Opt. Eng., 1995, 34(3): 869~875

    [8] [8] Jian Liu, R. M. A. Azzam. Infrared quarter-wave reflection retarders designed with high-spatial-frequency dielectric surface-relief gratings on a gold substrate at oblique incidence [J]. Appl. Opt., 1996, 35(28): 5557~5562

    [9] [9] Eberhard Spiller. Totally reflecting thin-film phase retarders [J]. Appl. Opt., 1984, 23(20): 3544~3549

    [11] [11] Daniel Poitras, J. A. Dobrowolski, Tom Cassidy et al.. Ion-beam etching for the precise manufacture of optical coatings [J]. Appl. Opt., 2003, 42(19): 4037~4044

    [12] [12] Shiuh Chao, Wen-Hsiang Wang, Cheng-Chung Lee. Low-loss dielectric mirror with ion-beam-sputtered TiO2-SiO2 mixed films [J]. Appl. Opt., 2001, 40(13): 2177~2182

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Investigation on Properties of Reflection Phase Retarder[J]. Chinese Journal of Lasers, 2005, 32(6): 761

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    Paper Information

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    Received: Jun. 3, 2004

    Accepted: --

    Published Online: Jun. 6, 2006

    The Author Email: (laserhjb9@mail.siom.ac.cn)

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