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Microelectronics, Volume. 52, Issue 4, 706(2022)

Study on Total-Ionizing-Dose Radiation Induced BV Degradation of High Voltage SOI pLDMOS

HUANG Keyue1, WU Zhonghua2, ZHOU Miao3, CHEN Weizhong1, WANG Zhao2, and ZHOU Xin2
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    HUANG Keyue, WU Zhonghua, ZHOU Miao, CHEN Weizhong, WANG Zhao, ZHOU Xin. Study on Total-Ionizing-Dose Radiation Induced BV Degradation of High Voltage SOI pLDMOS[J]. Microelectronics, 2022, 52(4): 706

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    Received: Oct. 11, 2021

    Accepted: --

    Published Online: Jan. 18, 2023

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.220211

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology