A novel methodology for photometric compensation of projection display on patterned screen

Wenhai Zou; Haisong Xu; Bing Han; Dusik Park

doi:10.3788/COL20080607.0499

Chinese Optics Letters, Volume. 6, Issue 7, 499(2008)

A novel methodology for photometric compensation of projection display on patterned screen

Wenhai Zou^1、*, Haisong Xu¹, Bing Han², and Dusik Park²

Author Affiliations

¹State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027

²Computing and Intelligence Lab, Samsung Advanced Institute of Technology, Gyeonggi-Do 449-712, South Korea Received November 28, 2007

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Wenhai Zou, Haisong Xu, Bing Han, Dusik Park, "A novel methodology for photometric compensation of projection display on patterned screen," Chin. Opt. Lett. 6, 499 (2008)

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Paper Information

Received: Nov. 28, 2007

Accepted: --

Published Online: Jul. 11, 2008

The Author Email: Wenhai Zou (zwh_gd2001@yahoo.com.cn)

DOI:10.3788/COL20080607.0499

Topics

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Lasers and Laser Optics

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laser manufacturing

Instrumentation, Measurement and Metrology