Infrared and Laser Engineering, Volume. 51, Issue 4, 20210942(2022)
Application of terahertz mapping in high throughput measurement of the electrical conductance of Cu alloy thin films (Invited)
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Yu Zhu, Shihan Yan, Ziyi Zang, Shengxing Song, Jie Wang, Zhanqiang Ru, Hongliang Cui, Helun Song. Application of terahertz mapping in high throughput measurement of the electrical conductance of Cu alloy thin films (Invited)[J]. Infrared and Laser Engineering, 2022, 51(4): 20210942
Category: Invited paper
Received: Dec. 9, 2021
Accepted: Mar. 10, 2022
Published Online: May. 18, 2022
The Author Email: Shihan Yan (yanshihan@cigit.ac.cn), Helun Song (hlsong2008@sinano.ac.cn)