Optical Field Defect Regulation and Particle Capture of Localized Hollow Beam

Wensheng Fu; Xichun Zhang; Shangdian Zhu; Jinguang Lü; Xiaohui Ma; He Zhang

doi:10.3788/CJL202249.1305002

Chinese Journal of Lasers, Volume. 49, Issue 13, 1305002(2022)

Optical Field Defect Regulation and Particle Capture of Localized Hollow Beam

Wensheng Fu¹, Xichun Zhang¹, Shangdian Zhu¹, Jinguang Lü², Xiaohui Ma¹, and He Zhang^1、*

¹National Key Laboratory of High Power Semiconductor Lasers, Changchun University of Technology, Changchun 130022, Jilin, China

²National Key Laboratory of Applied Optics, Changchun Institute of Optical and Precision Machinery and Physics, Chinese Academy of Sciences, Changchun 130033, Jilin, China

show less

Abstract Get PDF(in Chinese)

Cited By

Article index updated: Mar. 10, 2025

The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)

Tools

Get Citation

Copy Citation Text

Wensheng Fu, Xichun Zhang, Shangdian Zhu, Jinguang Lü, Xiaohui Ma, He Zhang. Optical Field Defect Regulation and Particle Capture of Localized Hollow Beam[J]. Chinese Journal of Lasers, 2022, 49(13): 1305002

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Beam transmission and control

Received: Oct. 26, 2021

Accepted: Dec. 22, 2021

Published Online: Jun. 13, 2022

The Author Email: Zhang He (zhanghe@cust.edu.cn)

DOI:10.3788/CJL202249.1305002

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology