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Opto-Electronic Engineering, Volume. 34, Issue 5, 52(2007)

Theory and precision analysis of testing apparatus of parallel depth

[in Chinese]1,2, [in Chinese]1, [in Chinese]1, and [in Chinese]1
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Theory and precision analysis of testing apparatus of parallel depth[J]. Opto-Electronic Engineering, 2007, 34(5): 52

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    Received: Apr. 20, 2006

    Accepted: --

    Published Online: Nov. 14, 2007

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology