NUCLEAR TECHNIQUES, Volume. 45, Issue 10, 100204(2022)
Slow positron beam study on defects induced by Xe ions irridiation in matrix graphite of fuel elements
Figures & Tables(4)
Fig. 1. Depth profile of displacement per atom (DPA)(a) in graphite irradiated with 1 MeV Xe ions to the different fluences, and depth profile (DPA) of Xe ions concentrations irradiated to flux of 5.8×1014 ions·cm-2 (b), calculated by SRIM
Fig. 2. The S parameter as a function of positron incidence energy or mean implantation depth (S-E curve) for graphite before and after 1 MeV Xe ions irradiation
Fig. 3. The S-W parameter distribution for graphite with 1 MeV Xe ion irradiation
Fig. 4. The hardness as a function of Xe ion irradiation fluence and depth for graphite
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Hongxia XU, Jun LIN, Zhiyong ZHU, Jiandang LIU, Bingchuan GU, Bangjiao YE. Slow positron beam study on defects induced by Xe ions irridiation in matrix graphite of fuel elements[J]. NUCLEAR TECHNIQUES, 2022, 45(10): 100204
Paper Information
Category: Research Articles
Received: Feb. 10, 2022
Accepted: --
Published Online: Nov. 4, 2022
The Author Email: LIU Jiandang (liujd@ustc.edu.cn)
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