Acta Optica Sinica, Volume. 45, Issue 9, 0923004(2025)

Design of Nanoscale Patterned Al2O3‑SiO2 Substrate for Flip‑chip LEDs

Chengxi Xian1,2, Jianqiao Zhang2, Zirong Wang2、**, and Zhiyuan Li1、*
Author Affiliations
  • 1School of Physics and Optoelectronics, South China University of Technology, Guangzhou 510641, Guangdong , China
  • 2Sinopatt Technology Co., Ltd., Dongguan 523808, Guangdong , China
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    Figures & Tables(6)
    COMSOL wave optics simulation model and results. (a) Simulation model for transmittance of MMS; (b) transmittance spectral of MMS with periods of 1.0 μm and 3.0 μm at incident wavelength of 460 nm; (c) average transmittance of MMS with different periods at incident wavelength of 460, 560, and 780 nm; (d)‒(i) transmittance spectra of MMS with different periods at different incident wavelengths
    TracePro geometric optics simulation model and results. (a) Simulation model for LEE and far-field luminous angle of MMS-LED; (b) calculation model for axial light emission probability of flip-chip LEDs with MMS and PSS; (c) calculation model for light emission angle distribution of flip-chip LEDs with MMS and PSS; (d) LEE of MMS-LED with different diameters; (e) LEE of MMS-LED with different pattern heights; (f) luminous angle of MMS-LED with different pattern diameter; (g) luminous angle of MMS-LED with different pattern heights
    Fabrication process of nanoscale MMS
    Testing results of microscopic morphology of nanoscale MMS. (a) SEM image of axial view; (b) SEM image of side view; (c) SEM image of oblique axial view; (d) surface profile of pattern along dense direction tested by AFM
    • Table 1. LED structure parameters for Monte Carlo ray tracing

      View table

      Table 1. LED structure parameters for Monte Carlo ray tracing

      Structure

      Thickness /

      μm

      Reflective

      index

      Property
      Reflector0.05Reflectivity: 95%
      ITO0.102.00
      p-GaN0.202.45
      MQWs0.122.54

      Absorption coefficient:

      10 mm-1

      n-GaN4.002.45
      Sapphire5.001.76
    • Table 2. Simulation results using different materials as patterns

      View table

      Table 2. Simulation results using different materials as patterns

      Material

      Refractive

      index

      Axial

      LEE /%

      Luminous

      angle /(°)

      SiO21.4631.56124
      Al2O31.7628.73134
      AlN2.0026.79142
      GaN2.4514.85140
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    Chengxi Xian, Jianqiao Zhang, Zirong Wang, Zhiyuan Li. Design of Nanoscale Patterned Al2O3‑SiO2 Substrate for Flip‑chip LEDs[J]. Acta Optica Sinica, 2025, 45(9): 0923004

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    Paper Information

    Category: Optical Devices

    Received: Jan. 8, 2025

    Accepted: Mar. 13, 2025

    Published Online: May. 16, 2025

    The Author Email: Zirong Wang (zirong.wang@sinopatt.com), Zhiyuan Li (phzyli@scut.edu.cn)

    DOI:10.3788/AOS250463

    CSTR:32393.14.AOS250463

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