Microelectronics, Volume. 54, Issue 2, 323(2024)

Design and Validation of Ultra-High-Speed Data Acquisition and Analysis Platform

ZHANG Xuying1, LIU Yang1, PENG Zuguo1, XU Dekai1, WU Jiangxiong2, WEI Yafeng2, CHEN Chao2, WANG Cong2, WEN Xianchao2, WANG Jianan2, and YU Zhou2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    References(3)

    [2] [2] BRANNON B, REEDER R. Understanding high speed ADC testing and evaluation [EB/OL]. [2023-10-31]. http://application-notes.digchip.com/013/13-14799.pdf.

    [6] [6] CYPRESS. Cypress CyUsb3.sys programmer’s reference [EB/OL]. [2023-10-31]. https://www.infineon.com/cms/en/product/gated-document/download-cy3689-ez-usb-fx2lp-discovery-kit-zip-8ac78c8c84a33f400184bd8043450150/.

    [7] [7] Waveform Generation Measurement and Analysis Technical Committee. IEEE standard for terminology and test methods for analog-to-digital converters:IEEE Std 1241TM-2010 [S]. New York: IEEE, 2011:1-127.

    Tools

    Get Citation

    Copy Citation Text

    ZHANG Xuying, LIU Yang, PENG Zuguo, XU Dekai, WU Jiangxiong, WEI Yafeng, CHEN Chao, WANG Cong, WEN Xianchao, WANG Jianan, YU Zhou. Design and Validation of Ultra-High-Speed Data Acquisition and Analysis Platform[J]. Microelectronics, 2024, 54(2): 323

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Mar. 3, 2024

    Accepted: --

    Published Online: Aug. 21, 2024

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.240145

    Topics