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Spectroscopy and Spectral Analysis, Volume. 38, Issue 5, 1444(2018)

Time-Resolved Raman Scattering Measurement Based on SiPM and TCMPC Method

MIAO Quan-long1、*, DAI Lei1, LI Bai-cheng1, ZHAO Tian-qi1, LIANG Kun1,2, YANG Ru1,2, and HAN De-jun1,2
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  • 2[in Chinese]
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    [1] [1] Renker D, Lorenz E. Journal of Instrumentation, 2009, 4, 04004.

    [2] [2] Becker W. Journal of Microscopy, 2006, 222(1): 65.

    [3] [3] Morris M D, Matousek P, Towrie M, et al. J. Biomed. Opt., 2005, 10： 14014.

    [4] [4] Li B C, Miao Q L, Wang B C, et al. Proc. SPIE, 2016, 9850: 98580L.

    [5] [5] Gruber L, Brunner S E, Marton J, et al. Nuclear Instruments & Methods in Physics Research A, 2014, 737： 11.

    [6] [6] Max L A. OALib Journal, 2015, 1507： 00863.

    [7] [7] Fabio A, Alessandro F, Alberto G, et al. Nuclear Instruments & Methods in Physics Research A, 2015, 784： 34.

    [8] [8] Marinov O, Deen J, Tejada J A, et al. Journal of Applied Physics, 2007, 101： 064515.

    [9] [9] Gamal A, Paul B, Johann M, et al. Nuclear Instruments & Methods in Physics Research A, 2011, 652： 528.

    [10] [10] Gundacker S, Auffray E, Vara N D, et al. Nuclear Instruments & Methods in Physics Research A, 2013, 718： 569.

    [11] [11] Sinfield J V, Colic O, Fagerman D, et al. Applied Spectroscopy, 2010, 64： 201.

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    MIAO Quan-long, DAI Lei, LI Bai-cheng, ZHAO Tian-qi, LIANG Kun, YANG Ru, HAN De-jun. Time-Resolved Raman Scattering Measurement Based on SiPM and TCMPC Method[J]. Spectroscopy and Spectral Analysis, 2018, 38(5): 1444

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    Paper Information

    Received: Jun. 8, 2017

    Accepted: --

    Published Online: Jun. 1, 2018

    The Author Email: Quan-long MIAO (314647104@qq.com)

    DOI:10.3964/j.issn.1000-0593(2018)05-1444-07

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology