Infrared Technology, Volume. 47, Issue 8, 1035(2025)

Automatic Measurement Method for Defect Size by Infrared Thermography

Ying HONG1, Jinling WANG1, Fei CHEN2, Kai ZHANG2, and Haijun JIANG2、*
Author Affiliations
  • 1Nanjing Customs Industrial Products Inspection Center, Nanjing 210019, China
  • 2Novelteq Co. Ltd., Nanjing 210014, China
  • show less
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    HONG Ying, WANG Jinling, CHEN Fei, ZHANG Kai, JIANG Haijun. Automatic Measurement Method for Defect Size by Infrared Thermography[J]. Infrared Technology, 2025, 47(8): 1035

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: May. 16, 2024

    Accepted: Sep. 15, 2025

    Published Online: Sep. 15, 2025

    The Author Email: JIANG Haijun (hjiang@novelteq.com)

    DOI:

    Topics