Spintronic Terahertz Emission Spectroscopy Based on Ultrafast Terahertz Scattering Scanning Near-Field Optical Microscope (Invited)

Jiaqi Wang; Mingcong Dai; Yihang Ma; Youwei Wang; Zijian Zhang; Jiahua Cai; Peng Chen; Caihua Wan; Xiufeng Han; Xiaojun Wu

doi:10.3788/LOP232441

Laser & Optoelectronics Progress, Volume. 61, Issue 3, 0325001(2024)

Spintronic Terahertz Emission Spectroscopy Based on Ultrafast Terahertz Scattering Scanning Near-Field Optical Microscope (Invited)

Jiaqi Wang¹, Mingcong Dai¹, Yihang Ma¹, Youwei Wang¹, Zijian Zhang², Jiahua Cai¹, Peng Chen³, Caihua Wan³, Xiufeng Han³, and Xiaojun Wu^1,4、*

Author Affiliations

¹School of Electronic and Information Engineering, Beihang University, Beijing 100191, China

²School of Physics, University of Electronic Science and Technology of China, Chengdu 611731, Sichuan , China

³Institute of Physics, Chinese Academy of Sciences, Beijing 100191, China

⁴Zhangjiang Laboratory, Shanghai 201210, China

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Jiaqi Wang, Mingcong Dai, Yihang Ma, Youwei Wang, Zijian Zhang, Jiahua Cai, Peng Chen, Caihua Wan, Xiufeng Han, Xiaojun Wu. Spintronic Terahertz Emission Spectroscopy Based on Ultrafast Terahertz Scattering Scanning Near-Field Optical Microscope (Invited)[J]. Laser & Optoelectronics Progress, 2024, 61(3): 0325001

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Paper Information

Category: OPTOELECTRONICS

Received: Nov. 6, 2023

Accepted: Nov. 15, 2023

Published Online: Feb. 27, 2024

The Author Email: Wu Xiaojun (xiaojunwu@buaa.edu.cn)

DOI:10.3788/LOP232441

CSTR:32186.14.LOP232441

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology