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Acta Optica Sinica, Volume. 23, Issue 12, 1418(2003)

Characterization of Ion Exchange Erbium-Doped Silica Glass Amplifiers

[in Chinese]1、*, [in Chinese]1, [in Chinese]1, [in Chinese]1, and [in Chinese]2
Author Affiliations
  • 1[in Chinese]
  • 2IFAC-CNR, Via Panciatichi 64, Firenze, Italy
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Characterization of Ion Exchange Erbium-Doped Silica Glass Amplifiers[J]. Acta Optica Sinica, 2003, 23(12): 1418

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    Paper Information

    Category: Fiber Optics and Optical Communications

    Received: Nov. 13, 2002

    Accepted: --

    Published Online: Jun. 27, 2006

    The Author Email: (jiezheng@public.cc.jl.cn)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology