Chinese Journal of Lasers, Volume. 51, Issue 23, 2304002(2024)

Focal‑Length and Wavefront Measurements of Lenses with Large Apertures and Long Focal Lengths

Xiaomeng Sun1,2, Xuejie Zhang2、*, Fangfang Cheng2, Shenlei Zhou2, Weixing Shen2, Xiaojun Ma2, Cheng Liu2, and Jianqiang Zhu1,2、**
Author Affiliations
  • 1Department of Optics and Optical Engineering, University of Science and Technology of China, Hefei 230026, Anhui , China
  • 2Key Laboratory of High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
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    Figures & Tables(8)
    Schematic of measurement principle
    Experimental setup
    Recorded diffraction patterns. (a) With tested lens in optical path; (b) without tested lens in optical path
    Reconstructed amplitude distributions
    Measurement results of wavefront error of reference lens. (a) Proposed method; (b) interferometer
    Measurement results of tested lens. (a) Maximum intensity versus distance; (b) amplitude distribution of light field near focal plane; (c) wavefront error
    Error relationship curves. (a) Absolute error; (b) relative error
    • Table 1. Effects of PIE measurement errors on lens focal length and wavefront error

      View table

      Table 1. Effects of PIE measurement errors on lens focal length and wavefront error

      Source of errorError valueRelative error of focal lengthRoot mean square value of wavefront error
      Total error1.016×10-50.0058λ
      Reconstruction algorithm2.86×10-60.0029λ
      Noise recorded by detector11.05×10-60.0048λ
      Diffractive object scanning error0.1 pixel4.48×10-60.0013λ
      Distance error between diffractive object and detector0.1 mm8.60×10-60.0008λ
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    Xiaomeng Sun, Xuejie Zhang, Fangfang Cheng, Shenlei Zhou, Weixing Shen, Xiaojun Ma, Cheng Liu, Jianqiang Zhu. Focal‑Length and Wavefront Measurements of Lenses with Large Apertures and Long Focal Lengths[J]. Chinese Journal of Lasers, 2024, 51(23): 2304002

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    Paper Information

    Category: Measurement and metrology

    Received: Mar. 21, 2024

    Accepted: Apr. 29, 2024

    Published Online: Dec. 11, 2024

    The Author Email: Zhang Xuejie (sddxzxj@126.com), Zhu Jianqiang (jqzhu@mail.shcnc.ac.cn)

    DOI:10.3788/CJL240703

    CSTR:32183.14.CJL240703

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