[1] [1] Chen Jinjun. The Research of Interferometry Test with the Way of FFT[D]. Nanjing: Nanjing Institute of Technology, 2004

[2] [2] M. Takeda. Spatial carrier heterodyne techniques for precision interferometry and profilometry: an overview[C]. Proc. SPIE, 1989, 1121: 73～88

[3] [3] Zhang Jie, Cheng Mingyi. A new out-inserting algorithm about interference fringe during Fourier transformation[J]. The Optical Instruments, 1998, 11(1): 20～26

[4] [4] Nie Liang. The Research of the Key about Phase-Shifting Interferometry with Fiber Point Diffraction[D]. Beijing: Beijing Institute of Technology, 2006

[5] [5] Liu Yueai. A simple method of Zernike polynomial fitting in fringe analysis[J]. Acta Optica Sinica, 1985, 5(4): 368～373

[6] [6] Tan Zhongqi. The Research of Wavelength-Tuned Phase-Shifting Interferometry[D]. Changsha: National University of Defense Technology, 2003

[7] [7] Yan Jingzhou, Lei Fan, Zhou Bifang et al.. Algorit hms for wavef ront fitting using Zernike polynomial[J]. Optics and Precision Engineering, 1999, 7(5): 119～128

[8] [8] Liang Liping. Testing Big Curvature Surface of Optical Element on Plane Interferometer with Spatial Carrier Heterodyne Interferometry[D]. Changsha: National University of Defense Technology, 2007

[9] [9] Mo Weidong. The Research of Test System of Optical Flat Glass Surface[D]. Changsha: National University of Defense Technology, 1990

[10] [10] J. Schwider, R. Burow, K.-E. Elssner, J. Grzanna et al.. Digital wave-front measuring interfermetry: some systematic error sources[J]. Appl. Opt., 1983, 22(21): 3421～3432