[1] [1] Charles R.Steinmetz. Laser interferometry operates at submicrometer level [J]. Laser Focus World, 1990, (7):93～98

[2] [2] Shizhou Zhang, Satoshi Kiyono, Yutaka Uda. Nanoradian angle sensor and in situ self-calibration [J]. Appl. Opt., 1998, 37(19):4154～4159

[5] [5] Zhang Caini, Wang Xiangzhao. Sinusoidal phase-modulating laser diode interferometer for measuring angular displacement [J]. Opt. Eng., 2004, 43(12):3008～3013

[9] [9] Osami Sasaki, Kazuhide Takahashi. Sinusoidal phase modulating interferometer using optical fibers for displacement measurement [J]. Appl. Opt., 1988, 27(19):4139～4142

[10] [10] Daniel Malacara. Optical Shop Testing [M]. Second Edition. United States of America: John Wiley & Sons, Inc., 1992.151～152

[11] [11] Osami Sasaki, Hirokazu Okazaki. Analysis of measurement accuracy in sinusoidal phase modulating interferometry [J]. Appl. Opt., 1986, 25(18):3152～3158