Photonics Research, Volume. 10, Issue 12, 2901(2022)

Direct measurement of topological invariants in photonic superlattices Editors' Pick

Ze-Sheng Xu1, Jun Gao1,2、*, Govind Krishna1, Stephan Steinhauer1, Val Zwiller1, and Ali W. Elshaari1,3、*
Author Affiliations
  • 1Department of Applied Physics, Royal Institute of Technology, Albanova University Centre, 106 91 Stockholm, Sweden
  • 2e-mail:
  • 3e-mail:
  • show less
    References(35)

    [33] L. Chrostowski, M. Hochberg. Silicon Photonics Design: From Devices to Systems(2015).

    Tools

    Get Citation

    Copy Citation Text

    Ze-Sheng Xu, Jun Gao, Govind Krishna, Stephan Steinhauer, Val Zwiller, Ali W. Elshaari, "Direct measurement of topological invariants in photonic superlattices," Photonics Res. 10, 2901 (2022)

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Physical Optics

    Received: Aug. 29, 2022

    Accepted: Oct. 27, 2022

    Published Online: Dec. 5, 2022

    The Author Email: Jun Gao (junga@kth.se), Ali W. Elshaari (elshaari@kth.se)

    DOI:10.1364/PRJ.474165

    Topics