Acta Optica Sinica, Volume. 43, Issue 22, 2229001(2023)

Deep Learning-Based Particle Shape Classification Using Low-Bit-Depth Speckle Patterns in Interferometric Particle Imaging

Yushi Fu1,2, Hongxia Zhang1,2、*, Jinghui Hou1,2, Dagong Jia1,2, and Tiegen Liu1,2
Author Affiliations
  • 1School of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China
  • 2Key Laboratory of the Ministry of Education on Optoelectronic Information Technology, Tianjin University, Tianjin 300072, China
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    Yushi Fu, Hongxia Zhang, Jinghui Hou, Dagong Jia, Tiegen Liu. Deep Learning-Based Particle Shape Classification Using Low-Bit-Depth Speckle Patterns in Interferometric Particle Imaging[J]. Acta Optica Sinica, 2023, 43(22): 2229001

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    Paper Information

    Category: Scattering

    Received: Jun. 25, 2023

    Accepted: Aug. 2, 2023

    Published Online: Nov. 20, 2023

    The Author Email: Zhang Hongxia (