Chinese Journal of Lasers, Volume. 26, Issue 6, 489(1999)

Effect of Impurities on Laser Induced Damage to 1.06 μm Optical Coatings

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    References(6)

    [1] [1] K. H. Guenther, T. W. Humpherys, J. Balmer et al.. 1.06-μm laser damage of thin film optical coatings: a round-robin experiment involving various pulse lengths and beam diameters. Appl. Opt., 1984,23(21):3743~3752

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    [4] [4] Peifu Gu. Technology of Thin Film Coating. Hangzhou: Zhejiang University Publishing House, 1990. 200~217 (in Chinese)

    [5] [5] F. L. Williams, G. A. Petersen, Jr., R. A. Schmell et al.. Observation and control of thin-film defects using in-situ total internal reflection microscopy. SPIE, 1991,1624:256~270

    [6] [6] Zhao Qiang, Fan Zhengxu, Wang Zhijiang. Study on laser conditioning of optical coatings. Chinese J. Lasers, 1996,B5(4):371~374

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Effect of Impurities on Laser Induced Damage to 1.06 μm Optical Coatings[J]. Chinese Journal of Lasers, 1999, 26(6): 489

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    Received: Dec. 25, 1997

    Accepted: --

    Published Online: Aug. 9, 2006

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