Optoelectronic Technology, Volume. 43, Issue 3, 269(2023)
Research on High Precision Vacuum Ultraviolet Spectroradiometer Technology
Fig. 2. Off‑axis aspherical double reflection ultraviolet optical system
Fig. 4. Reflectivity of the mirror at incident angles of 15 ° and 45 °
Fig. 5. Simulation curves of influence of MgF2 protective layer thickness on aluminum mirror reflectivity
Fig. 9. Curve chart of signal to noise ratio as a function of bias voltage
Fig. 12. Simulation nephogram of static displacement and stress of vacuum chamber
Fig. 13. Simulation nephogram of stress and static displacement of upper cover of cabin
Fig. 15. Responsiveness curve near the center wavelength of 121.2 nm
Fig. 16. Responsiveness curve near the center wavelength of 135.6 nm
Fig. 17. Responsiveness curve near the center wavelength of 160 nm
Fig. 18. Responsiveness curve near the center wavelength of 180 nm
Fig. 19. Responsiveness curve near the center wavelength of 200 nm
Fig. 20. Spectroradiometer working wavelength signal-to-noise ratio curve
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Hao LIU, Tianqi ZHAO, Chunlian ZHAN, Yanxia ZOU, Shangzhong JIN. Research on High Precision Vacuum Ultraviolet Spectroradiometer Technology[J]. Optoelectronic Technology, 2023, 43(3): 269
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Received: Mar. 9, 2023
Accepted: --
Published Online: Mar. 21, 2024
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