Acta Optica Sinica, Volume. 44, Issue 14, 1412001(2024)

Calibration Method of Frequency Scanning Interferometry Laser Ranging System

Yuchang Yan1,2, Linyang Xue1,2, Xiaosa Chen1,2, Guilin Chen1, and Changpei Han1、*
Author Affiliations
  • 1Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
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    Figures & Tables(9)
    Schematic diagram of the frequency scanning interferometry laser ranging system
    Measurement methods for system parameter calibration. (a) Zero-point relationship; (b) linear relationship
    Simulations of nonlinear correction in laser frequency scanning 1. (a) Drive current curve; (b) laser frequency curve; (c) frequency scanning speed curve
    Simulations of nonlinear correction in laser frequency scanning 2. (a) Drive current curve; (b) laser frequency curve; (c) frequency scanning speed curve
    System calibration experimental platform. (a) Measuring system; (b) system core internal structure
    Standard ruler
    Measurement of the linear relationship of the system
    Laser frequency scanning interferometry signal spectrums. (a) Before correction; (b) after correction
    • Table 1. System parameter calibration experiment results

      View table

      Table 1. System parameter calibration experiment results

      Data

      set

      Target

      number

      Angle

      θ /(°)

      Length

      LC /μm

      Spectral peak center positionSystem parameter
      P0PAPBα /μmβ /μm
      11-514.60306818796-0.31057180.23990990.22671585896391.91831253.0
      22-614.638908187690.23830590.22680025896392.01831253.0
      33-714.655568187100.23730410.22751115896392.11831253.0
      44-814.677238190720.23631800.22823215896392.01831253.0
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    Yuchang Yan, Linyang Xue, Xiaosa Chen, Guilin Chen, Changpei Han. Calibration Method of Frequency Scanning Interferometry Laser Ranging System[J]. Acta Optica Sinica, 2024, 44(14): 1412001

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Feb. 19, 2024

    Accepted: Mar. 29, 2024

    Published Online: Jul. 4, 2024

    The Author Email: Han Changpei (changpei_han@mail.sitp.ac.cn)

    DOI:10.3788/AOS240643

    CSTR:32393.14.AOS240643

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