[1] [1] Swanepoel R. Determination of the thickness and optical constants of amorphous silicon. J. Phys. (E), 1983, 16:1214～1222

[2] [2] Arndt D P, Azzam R M A, Bennett J M et al.. Multiple determination of the optical constants of thin-film coating materials. Appl. Opt., 1984, 23(20):3571～3596

[6] [6] Forouhi A R, Bloomer I. Simultaneous determination of thichness and optical constants of thin films. Proc. SPIE, 1995, 2439:126～136

[7] [7] Bosch S, Ferre-Borrull J, Sancho-Parramon J et al.. A general-purpose software for optical characterization of thin films:specific features for microelectronic applications. Solid-State Electronics, 2001, 45(5):703～709

[12] [12] Hamberg I, Granqvist C G. Evaporated Sn-doped In2O3 films: Basic optical properties and applications to energy-efficient windows. J. Appl. Phys., 1986, 60(11):123～159

[13] [13] Jellison G E. Parameterization of the optical functions of amorphous materials in the interband region. Appl. Phys. Lett., 1996, 69(3):371～373