Research on the Technology of Directly Labeling Titanium Alloy Based on 1 060 nm MOPA Laser

Chen Yuan; Zhang Yunfei; Yang Siqi

doi:10.14128/j.cnki.al.20254501.068

APPLIED LASER, Volume. 45, Issue 1, 68(2025)

Research on the Technology of Directly Labeling Titanium Alloy Based on 1 060 nm MOPA Laser

Chen Yuan^1,2, Zhang Yunfei^3、*, and Yang Siqi³

Author Affiliations

¹Shanghai Institute of Laser Technology Co., Ltd., Shanghai 200233, China

²Shanghai DPM Traceability Engineering Research Center, Shanghai 200233, China

³Collections Conservation Research Center, Shanghai Natural History Museum (Branch of Shanghai Science and Technology Museum), Shanghai 200041, China

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References(5)

[2] [2] HAYNES W M. CRC handbook of chemistry and physics［M］. Boca Raton: CRC Press, 2014.

[3] [3] KAESTNER P, OLFE J, HE J W, et al.Improvement in the load-bearing capacity and adhesion of TiC coatings on TiAl6V4 by duplex treatment［J］. Surface and Coatings Technology, 2001, 142: 928-933.

[4] [4] LAVISSE L, JOUVARD J M, IMHOFF L, et al. Pulsed laser growth and characterization of thin films on titanium substrates［J］. Applied Surface Science, 2007, 253(19): 8226-8230.

[6] [6] LUO FF, ONG W, GUAN Y C, et al. Study of micro/nanostructures formed by a nanosecond laser in gaseous environments for stainless steel surface coloring［J］. Applied Surface Science, 2015, 328: 405-409.

[9] [9] ADAMS D P, MURPHY R D, SAIZ D J, et al. Nanosecond pulsed laser irradiation of titanium: Oxide growth and effects on underlying metal［J］. Surface and Coatings Technology, 2014, 248: 38-45.

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Chen Yuan, Zhang Yunfei, Yang Siqi. Research on the Technology of Directly Labeling Titanium Alloy Based on 1 060 nm MOPA Laser[J]. APPLIED LASER, 2025, 45(1): 68

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Paper Information

Category:

Received: May. 17, 2023

Accepted: Apr. 17, 2025

Published Online: Apr. 17, 2025

The Author Email: Zhang Yunfei (zhangyf@sstm.org.cn)

DOI:10.14128/j.cnki.al.20254501.068

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology